Wednesday, April 17, 2019
IEEE Technical paper based on 1597.1 standard in Electromagnetic Lab Report
IEEE Technical constitution ground on 1597.1 standard in Electromagnetic compatibility - Lab Report ExampleTo achieve this, we performed a series of shielding effectiveness (SE) tests for a board level shielding product with different apertures by means of a reverberation chamber. An analytical shielding effectiveness formulation has been developed in comparing with the shielding effectiveness (SE) measurement results.When performing tasks related to electromagnetic shielding, Board Level Shielding (BLS) is wide used for isolating electromagnetic interferences. A typically perfect Board Level Shielding (BLS) is deemed to save no apertures and it is fixed to the ground plate of the circuit board all round in show to reach maximum shielding effectiveness (SE). By introducing several apertures, we can be able to figure out the Board Level Shielding (BLS) lighter weight and increase its convenience. To evaluate the effect of the aperture size and the total number of apertures on t he shielding effectiveness, several tests were performed in the lab and a number of apertures of different sizes and the results obtained were comp ared. The results are processed and used to plot the corresponding shielding effectiveness (SE) data using calculation tools based on the shielding theory.The IEEE standard 1597.1 demands that we use feature selective (FSV) to compare the level of agreement between the reference and the numerical results. In this method, the data sets are compared by decomposing them into two partsThis approach involves winning the overlapping portion of the two datasets and interpolating them so that they share a coincident x axis location. A Fourier transformation is then used to transform this data. The two data sets are low (DC), band (L0) and spicy pass (Hi) filtered. The six elements are then inversely transformed. Comparing the trend data gives the Amplitude divergency Measure (ADM).Shielding effectiveness of an aperture
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